Fraunhofer USA Center Midwest CMWFraunhofer USA CMW houses an advanced crystal measurement platform of x-ray diffraction (XRD) supporting the analysis of small to large area thin film and bulk crystalline material. The XRD platform is designed to support microstructure measurement of polycrystalline coatings or films, bulk crystals, and powder samples.
XRD Analysis
Capabilities
Capabilities include selectable point measurement on sample, microbeam x-ray spot size, 0 – 100 mm diameter area mapping of crystalline microstructure, texture analysis, residual stress analysis, phase identification, and microstructural analysis as a function of location (0, 1, and 2D mapping). System features include:
Linked CCD camera picture to measurement location
Small (300 micron) to large (15 mm) x-ray spot size
Small to large (up to 100 mm diameter) sample sizes
Sample positioning in 5 dimensions; x, y, z, φ (yaw), and χ (roll) with ± 5 micron accuracy
3 kW Cu Kα source of x-rays (1.5406 Å)
Enhanced signal to noise 0D scintillation detector
Low (fast) to high (slow) resolution optics
Software packages; residual stress, texture, phase identification, reciprocal space mapping, 0D to 2D area data visualization
